FOR ENQUIRIES
+44(0) 1202 307650
Designed and manufactured in the UK

Cadmium Telluride (CdTe)

Cadmium Telluride (CdTe) Data Sheet      ♦ Cadmium Telluride (CdTe) MSDS

Cadmium Telluride can be used for spectroscopy and where deep IR transmission is required. It is relatively workable and offers transmission to >20 microns.

CdTe has some application for solar cells.

Transmission Range :0.85 to > 20 micron (1)(3)
Refractive Index :2.653 @ 10 microns (1)
Reflection Loss :32% @ 10 microns
Absorption Coefficient :n/a
Reststrahlen Peak :n/a
dn/dT :5.0 x 10-5 K-1
dn/dμ = 0 :n/a
Density :6.2 g cm-3 (2)
Melting Point :1092 °C
Thermal Conductivity :6.2 W.m-1.K-1 at 293 K
Thermal Expansion :5.9x10-6 K-1 at 293 K
Hardness :Knoop 45 (3)
Specific Heat Capacity :210 J.kg-1.K-1 at 293 K
Dielectric Constant :11 @ 1MHz
Youngs Modulus (E) :36.52 GPa
Shear Modulus (G) :n/a
Bulk Modulus (K) :25 GPa
Elastic Coefficients :C11=53.51; C12=36.81; C44=19.94
Apparent Elastic Limit :5.9 MPa (3)
Poisson Ratio :0.41
Solubility :Insoluble in water
Molecular Weight :240.02
Class/Structure :Cubic ZnS (110) cleavage

To download this data or our MSDS safety data sheet as a pdf, please click on the links at the top of the page.  To expand the transmission graphs, please click on the image.


µm   Noµm   Noµm   No
0.8   2.8761.0   2.8402.0   2.713
2.5   2.7023.0   2.6953.5   2.691
4.0   2.68075.0   2.6846.0   2.681
7.0   2.6798.0   2.67710.0   2.653
12.5   2.64615.5   2.640720.0   2.614
22.2   2.60124.8   2.580126.32   2.570
27.03   2.564

CdTe is rarely used because of its toxicity. The finished optics are not particularly hazardous but should be handled with care. However, difficulties with processing cadmium compounds means that very few optical companies will cut and polish the material. Crystran Ltd does NOT supply CdTe. This data is provided for reference only.

A form of CdTe was originally utilised as the obsolete Kodak designation of IRTRAN-6

CAUTION: Cadmium salts are TOXIC and should be handled with care.

REFERENCES:
(1) Handbook Optical Constants, ed Palik, V1, ISBN 0-12-544420-6
(2) NIST USA data
(3) Hawkins, Sherwood, Djotni: Mid IR Filters for astronomical and remote sensing instrumentation. Invited Paper SPIE Conference Glasgow 2008